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Microelectronic Reliability Vol. I: Test and Diagnostics Books| ISBN: 9780890062845
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Microelectronic Reliability Vol. I: Test and Diagnostics
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Book Details
Author
Edward B. Hakim
Width
6.34 inch
Height
0.98 inch
Weight
771 g
Binding
Hardcover
Number of Pages
396 Pages
Series Name
Materials science library
Introduction By
Edward B. Hakim
Publisher
Artech House Publishers
Publication Year
1989
ISBN-13
9780890062845
ISBN-10
890062846
Language
English
Edition
illustrated edition
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